Threshold Switching Characteristics of Nb/NbO<sub>2</sub>/TiN Vertical Devices

We have observed threshold switching (TS) with minimal hysteresis and a small threshold electric field (60-90 kV/cm) in Nb/NbO<sub>2</sub>/TiN structures. The TS was unipolar with certain repeatability. A less sharp but still sizable change in the device resistance can be observed up to...

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Bibliographic Details
Main Authors: Yuhan Wang, Ryan B. Comes, Stuart A. Wolf, Jiwei Lu
Format: Article
Language:English
Published: IEEE 2016-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7337365/