An Efficient Degraded Deductive Fault Simulator for Small-Delay Defects
An efficient degraded deductive simulator for small delay defects is proposed. The proposed method takes into account the conditions of re-convergence sensitization and hazard-based detection, providing fast and accurate simulation results for small delay defects. Separate simulation strategies for...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9256321/ |