FORECASTING METHOD OF PARAMETRIC Reliability of electronic devices BY MODEL OF functional parameter'S DEGRADATION
The method of obtaining the model, describing degradation regularity for function parameter of electronic device (ED) sample, was systematized. The probability distribution function (for operating time of interest) of function parameter of ED sample is considered as a model of degradation. On the ba...
| Main Authors: | , |
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| Format: | Article |
| Language: | Russian |
| Published: |
Educational institution «Belarusian State University of Informatics and Radioelectronics»
2019-06-01
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| Series: | Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki |
| Subjects: | |
| Online Access: | https://doklady.bsuir.by/jour/article/view/350 |