A collisional model for AFM manipulation of rigid nanoparticles
The trajectories of differently shaped nanoparticles manipulated by atomic force microscopy are related to the scan path of the probing tip. The direction of motion of the nanoparticles is essentially fixed by the distance b between consecutive scan lines. Well-defined formulas are obtained in the c...
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2010-12-01
|
| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.1.19 |