Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays

Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays

This paper introduces a near-field measurement system concept for the fast testing of linear arrays suited for mass production scenarios where a high number of nominally identical antennas needs to be measured. The proposed system can compute the radiation pattern, directivity and gain on the array...

Full description

Bibliographic Details
Main Authors: Fernando Rodríguez Varela, Manuel José López Morales, Rubén Tena Sánchez, Alfonso Tomás Muriel Barrado, Elena de la Fuente González, Guillermo Posada Quijano, Carlos Zarzuelo Torres, Manuel Sierra Pérez, Manuel Sierra Castañer
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Sensors
Subjects:
antenna measurements
multi-probe
single-cut transformation
linear array
plane wave spectrum
anechoic chamber
Online Access:https://www.mdpi.com/1424-8220/21/5/1744

Internet

https://www.mdpi.com/1424-8220/21/5/1744

Similar Items