Multi-Probe Measurement System Based on Single-Cut Transformation for Fast Testing of Linear Arrays
This paper introduces a near-field measurement system concept for the fast testing of linear arrays suited for mass production scenarios where a high number of nominally identical antennas needs to be measured. The proposed system can compute the radiation pattern, directivity and gain on the array...
Main Authors: | , , , , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-03-01
|
Series: | Sensors |
Subjects: | |
Online Access: | https://www.mdpi.com/1424-8220/21/5/1744 |