Model-Based Test Suite Generation Using Mutation Analysis for Fault Localization

Fault localization techniques reduce the effort required when debugging software, as revealed by previous test cases. However, many test cases are required to reduce the number of candidate fault locations. To overcome this disadvantage, various methods were proposed to reduce fault-localization cos...

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Bibliographic Details
Main Authors: Yoo-Min Choi, Dong-Jin Lim
Format: Article
Language:English
Published: MDPI AG 2019-08-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/9/17/3492