Scattering Loss Estimation Using 2-D Fourier Analysis and Modeling of Sidewall Roughness on Optical Waveguides

Scattering Loss Estimation Using 2-D Fourier Analysis and Modeling of Sidewall Roughness on Optical Waveguides

We report an accurate scattering loss 3-D modeling technique of sidewall roughness of optical SOI waveguides based on Fourier and finite-difference time domain (FDTD) analysis methods. The Fourier analysis method is based on the image recovery technique used in magnetic resonant imaging. Losses for...

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Bibliographic Details
Main Authors: E. Jaberansary, T. M. B. Masaud, M. M. Milosevic, M. Nedeljkovic, G. Z. Mashanovich, H. M. H. Chong
Format: Article
Language:English
Published: IEEE 2013-01-01
Series:IEEE Photonics Journal
Subjects:
Roughness
scattering loss
optical waveguide
Online Access:https://ieeexplore.ieee.org/document/6476621/

Internet

https://ieeexplore.ieee.org/document/6476621/

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