Anomaly Detection and Degradation Prediction of MOSFET
The MOSFET is an important power electronic transistor widely used in electrical systems. Its reliability has an effect on the performance of systems. In this paper, the failure models and mechanisms of MOSFETs are briefly analyzed. The on-resistance Ron is the key failure precursor parameter repres...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2015-01-01
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| Series: | Mathematical Problems in Engineering |
| Online Access: | http://dx.doi.org/10.1155/2015/573980 |