Single crystals of bismuth silicon oxide grown by the czochralski technique and their characterisation
Single crystals of Bi12SiO20 were grown by the Czochralski technique. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. X-Ray measurements were performed on powdered samples to obtain the lattice parameters. Th...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Serbian Chemical Society
1999-01-01
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| Series: | Journal of the Serbian Chemical Society |
| Subjects: | |
| Online Access: | http://www.doiserbia.nb.rs/img/doi/0352-5139/1999/0352-51399909553G.pdf |