A GaN-HEMT Compact Model Including Dynamic <i>R</i>_DSon Effect for Power Electronics Converters

• Main Authors: Ke Li, Paul Leonard Evans, Christopher Mark Johnson, Arnaud Videt, Nadir Idir
• Format: Article
• Language: English
• Published: MDPI AG 2021-04-01
• Series: Energies
• Subjects: GaN-HEMT; dynamic <i>R</i>_DSon; power electronics; compact model; simulation; switching transients
• Online Access: https://www.mdpi.com/1996-1073/14/8/2092

In order to model GaN-HEMT switching transients and determine power losses, a compact model including dynamic <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mi>R</mi><mi mathvariant="sans-serif">DSon</mi></msub></semantics></math></inline-formula> effect is proposed herein. The model includes mathematical equations to represent device static and capacitance-voltage characteristics, and a behavioural voltage source, which includes multiple RC units to represent different time constants for trapping and detrapping effect from 100 ns to 100 s range. All the required parameters in the model can be obtained by fitting method using a datasheet or experimental characterisation results. The model is then implemented into our developed virtual prototyping software, where the device compact model is co-simulated with a parasitic inductance physical model to obtain the switching waveform. As model order reduction is applied in our software to resolve physical model, the device switching current and voltage waveform can be obtained in the range of minutes. By comparison with experimental measurements, the model is validated to accurately represent device switching transients as well as their spectrum in frequency domain until 100 MHz. In terms of dynamic <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><msub><mi>R</mi><mi mathvariant="sans-serif">DSon</mi></msub></semantics></math></inline-formula> value, the mismatch between the model and experimental results is within 10% under different power converter operation conditions in terms of switching frequencies and duty cycles, so designers can use this model to accurately obtain GaN-HEMT power losses due to trapping and detrapping effects for power electronics converters.