Measurement of Force Curve due to Electrostatic Charge on a Single Particle using Atomic Force Microscope [Translated]†

Measurement of Force Curve due to Electrostatic Charge on a Single Particle using Atomic Force Microscope [Translated]†

A single particle is brought into contact with a metal target, and the force acting on the particle is measured by using atomic force microscope (AFM). By focusing on measuring the force ‘curve’, rather than looking only at the maximum adhesiv...

Full description

Bibliographic Details
Main Authors: Tatsushi Matsuyama, Masa-aki Ohtsuka, Hideo Yamamoto
Format: Article
Language:English
Published: Hosokawa Powder Technology Foundation 2014-03-01
Series:KONA Powder and Particle Journal
Subjects:
contact electrification
tribo-charging
tribo-electrification
adhesive force measurement
electrostatic adhesion
coulomb’s law
Online Access:https://www.jstage.jst.go.jp/article/kona/26/0/26_2008021/_pdf/-char/en

Internet

https://www.jstage.jst.go.jp/article/kona/26/0/26_2008021/_pdf/-char/en

Similar Items