Examination of Dentin Surface Using AFM (Our Experience)
Atomic force microscopy (AFM) as one the technique of Scanning Probe Microscopy is useful for imaging of surface structure. This method can yield three-dimensional high-resolution topographic images of sample surfaces by using a scanning technique for conductors and insulators on atomic scale. It is...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Karolinum Press
2004-01-01
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| Series: | Acta Medica |
| Subjects: | |
| Online Access: | https://actamedica.lfhk.cuni.cz/online_first/18059694.2018.121/ |