A Novel Hall Effect Sensor Using Elaborate Offset Cancellation Method
The Hall effect is caused by a traverse force that is formed in the electrons or holes of metal element or semiconductor when are polarized by current source and simultaneously all the system it is found vertical in external magnetic field. Result is finally the production of difference of potential...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
IFSA Publishing, S.L.
2009-01-01
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Series: | Sensors & Transducers |
Subjects: | |
Online Access: | http://www.sensorsportal.com/HTML/DIGEST/january_09/P_375.pdf |