Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications

The adoption of complex and technologically advanced integrated circuits (ICs) in safety-critical applications (e.g., in automotive) forced the introduction of new solutions to guarantee the achievement of the required reliability targets. One of these solutions lies in performing in-field test (i.e...

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Bibliographic Details
Main Authors: Andrea Floridia, Ernesto Sanchez, Matteo Sonza Reorda
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8715776/