Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by phys...

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Bibliographic Details
Main Authors: Miriam Jaafar, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, Agustina Asenjo
Format: Article
Language:English
Published: Beilstein-Institut 2011-09-01
Series:Beilstein Journal of Nanotechnology
Subjects:
electrostatic interaction
focused electron beam induced deposition
Kelvin probe force microscopy
magnetic force microscopy
magnetic nanostructures
Online Access:https://doi.org/10.3762/bjnano.2.59

Internet

https://doi.org/10.3762/bjnano.2.59

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