High-Rankness Regularized Semi-Supervised Deep Metric Learning for Remote Sensing Imagery

Deep metric learning has recently received special attention in the field of remote sensing (RS) scene characterization, owing to its prominent capabilities for modeling distances among RS images based on their semantic information. Most of the existing deep metric learning methods exploit pairwise...

Full description

Bibliographic Details
Main Authors: Jian Kang, Ruben Fernandez-Beltran, Zhen Ye, Xiaohua Tong, Pedram Ghamisi, Antonio Plaza
Format: Article
Language:English
Published: MDPI AG 2020-08-01
Series:Remote Sensing
Subjects:
Online Access:https://www.mdpi.com/2072-4292/12/16/2603