Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability Analysis

Practical Challenges of High-Power IGBT’s I-V Curve Measurement and Its Importance in Reliability Analysis

This paper examines the practical challenges of simplified setups aimed at achieving high-power IGBTs’ <i>I<sub>C</sub></i>–<i>V<sub>CE</sub></i> curve. The slope of this I–V curve (which is defined as on-resistance <i>R<sub>CE</sub>&...

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Bibliographic Details
Main Authors: Omid Alavi, Leander Van Cappellen, Ward De Ceuninck, Michaël Daenen
Format: Article
Language:English
Published: MDPI AG 2021-08-01
Series:Electronics
Subjects:
accelerated aging
electronic packaging thermal management
lifetime estimation
power electronics
semiconductor device reliability
Online Access:https://www.mdpi.com/2079-9292/10/17/2095

Internet

https://www.mdpi.com/2079-9292/10/17/2095

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