Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers

Shock Damage Analysis in Serial Femtosecond Crystallography Data Collected at MHz X-ray Free-Electron Lasers

Serial femtosecond crystallography (SFX) data were recorded at the European X-ray free-electron laser facility (EuXFEL) with protein microcrystals delivered via a microscopic liquid jet. An XFEL beam striking such a jet may launch supersonic shock waves up the jet, compromising the oncoming sample....

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Bibliographic Details
Main Authors: Alexander Gorel, Marie Luise Grünbein, Richard Bean, Johan Bielecki, Mario Hilpert, Michele Cascella, Jacques-Philippe Colletier, Hans Fangohr, Lutz Foucar, Elisabeth Hartmann, Mark S. Hunter, Henry Kirkwood, Marco Kloos, Romain Letrun, Thomas Michelat, Robert L. Shoeman, Jolanta Sztuk-Dambietz, Guillaume Tetreau, Herbert Zimmermann, Adrian P. Mancuso, Thomas R.M. Barends, R. Bruce Doak, Claudiu Andrei Stan, Ilme Schlichting
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Crystals
Subjects:
X-ray free-electron laser
serial femtosecond crystallography
shock wave
protein crystallography
Online Access:https://www.mdpi.com/2073-4352/10/12/1145

Internet

https://www.mdpi.com/2073-4352/10/12/1145

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