REFRACTIVE INDEX DETERMINATION FOR A PLANE DIELECTRIC LAYER USING THE MEASUREMENTS OF TRANSMITTED BEAM INTENSITY

The aim of the present work is the theoretical justification of new refractive index determination technique for a homogeneous transparent plane dielectric layer. It uses intensity measurements for two polarizations of transmitting electromagnetic beam and does not take into consideration phase rela...

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Bibliographic Details
Main Authors: V. M. Serdyuk, J. A. Titovitsky
Format: Article
Language:English
Published: Belarusian National Technical University 2017-02-01
Series:Pribory i Metody Izmerenij
Subjects:
Online Access:https://pimi.bntu.by/jour/article/view/288