REFRACTIVE INDEX DETERMINATION FOR A PLANE DIELECTRIC LAYER USING THE MEASUREMENTS OF TRANSMITTED BEAM INTENSITY
The aim of the present work is the theoretical justification of new refractive index determination technique for a homogeneous transparent plane dielectric layer. It uses intensity measurements for two polarizations of transmitting electromagnetic beam and does not take into consideration phase rela...
Main Authors: | V. M. Serdyuk, J. A. Titovitsky |
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Format: | Article |
Language: | English |
Published: |
Belarusian National Technical University
2017-02-01
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Series: | Pribory i Metody Izmerenij |
Subjects: | |
Online Access: | https://pimi.bntu.by/jour/article/view/288 |
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