Deep metric learning method for high resolution remote sensing image scene classification

Deep metric learning method for high resolution remote sensing image scene classification

Due to the similarity of intra-class and dissimilarity of inter-class of high-resolution remote sensing image scene, it is difficult to identify some image scene class. In this paper, a new classification approach for high-resolution remote sensing image scene is proposed based on deep learning and...

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Bibliographic Details
Main Authors: YE Lihua, WANG Lei, ZHANG Wenwen, LI Yonggang, WANG Zengkai
Format: Article
Language:zho
Published: Surveying and Mapping Press 2019-06-01
Series:Acta Geodaetica et Cartographica Sinica
Subjects:
deep learning
metric learning
average center metric loss
remote sensing image
scene classification
Online Access:http://html.rhhz.net/CHXB/html/2019-6-698.htm

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http://html.rhhz.net/CHXB/html/2019-6-698.htm

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