Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters

Increase in manufacturing test cost is of paramount issue to chip suppliers, which has been primarily due to costly external testers and long test-time. This paper proposes a loopback-based self-test technique to cost-effectively predict the dynamic nonlinearities of on-chip segmented digital-to-ana...

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Bibliographic Details
Main Authors: Byoungho Kim, Jacob A. Abraham
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8951107/