Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach
In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation...
Main Authors: | , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Beilstein-Institut
2020-05-01
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Series: | Beilstein Journal of Nanotechnology |
Subjects: | |
Online Access: | https://doi.org/10.3762/bjnano.11.58 |