Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach

In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation...

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Bibliographic Details
Main Authors: Edgar Cruz Valeriano, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon, José Martín Yañez Limón
Format: Article
Language:English
Published: Beilstein-Institut 2020-05-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
fast fourier transform
mechanical properties
system theory
white noise
Online Access:https://doi.org/10.3762/bjnano.11.58

Internet

https://doi.org/10.3762/bjnano.11.58

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