Imaging Conductive Objects Through Metal Enclosures Using ELF/VLF Magnetic Fields

Imaging Conductive Objects Through Metal Enclosures Using ELF/VLF Magnetic Fields

Imaging through conductive media is a pervasive problem in medical, industrial, and security applications. Several potential modalities such as X-ray, exotic particle beams, and related high resolution techniques have been employed in the past. However, the difficulty of production and safety of the...

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Bibliographic Details
Main Authors: Ho Y. Kim, Vijay Harid, Alexander Mroz, Joshua Wewerka, Dalibor J. Todorovski, Mark Golkowski, Ronald A. L. Rorrer, Morris B. Cohen, Nathan M. Opalinski
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Computational electromagnetics
extremely low frequency
near-field
nondestructive evaluation
surface integral equation
through conductor imaging
Online Access:https://ieeexplore.ieee.org/document/9078807/

Internet

https://ieeexplore.ieee.org/document/9078807/

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