Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization
In this study, a Zn–Sn–Cu sandwich structure was heated and electrically crystallized. The morphology, phase structure, diffusion behavior, and interface electrical properties of the sandwich structure and the microstructure changes in Zn, Sn, and Cu driven by heat and electricity were investigated....
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doaj-ff4e6d4ee4524526b17fbb8fd767c3da2021-01-02T05:12:19ZengElsevierJournal of Materials Research and Technology2238-78542020-11-01961554715554Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallizationTai-Hsiang Liu0Fei-Yi Hung1Kuan-Jen Chen2Department of Materials Science and Engineering, National Cheng Kung University, Tainan 701, TaiwanDepartment of Materials Science and Engineering, National Cheng Kung University, Tainan 701, Taiwan; Corresponding author.The Instrument Center, National Cheng Kung University, Tainan 701, TaiwanIn this study, a Zn–Sn–Cu sandwich structure was heated and electrically crystallized. The morphology, phase structure, diffusion behavior, and interface electrical properties of the sandwich structure and the microstructure changes in Zn, Sn, and Cu driven by heat and electricity were investigated. The experimental results revealed that thermal effects caused marked diffusion of Cu atoms. Cu6Sn5 IMC was formed at the Cu–Sn interface, and Cu5Sn8 was formed at the Zn–Sn interface. The electron flow drove Sn atoms into Cu with directional diffusion and inhibited Cu6Sn5 formation. Moreover, the overall electrical properties, interlayer thickness, and microstructure differences varied with the diffusion behavior and interface composition caused by thermal and electrical effects.http://www.sciencedirect.com/science/article/pii/S2238785420319657InterfaceThermal diffusionElectrically induced crystallization (EIC)Directional diffusion |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Tai-Hsiang Liu Fei-Yi Hung Kuan-Jen Chen |
spellingShingle |
Tai-Hsiang Liu Fei-Yi Hung Kuan-Jen Chen Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization Journal of Materials Research and Technology Interface Thermal diffusion Electrically induced crystallization (EIC) Directional diffusion |
author_facet |
Tai-Hsiang Liu Fei-Yi Hung Kuan-Jen Chen |
author_sort |
Tai-Hsiang Liu |
title |
Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization |
title_short |
Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization |
title_full |
Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization |
title_fullStr |
Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization |
title_full_unstemmed |
Interface behavior and electrical properties of Zn–Sn–Cu (CTZ) stacking layer films with thermal diffusion and electrically induced crystallization |
title_sort |
interface behavior and electrical properties of zn–sn–cu (ctz) stacking layer films with thermal diffusion and electrically induced crystallization |
publisher |
Elsevier |
series |
Journal of Materials Research and Technology |
issn |
2238-7854 |
publishDate |
2020-11-01 |
description |
In this study, a Zn–Sn–Cu sandwich structure was heated and electrically crystallized. The morphology, phase structure, diffusion behavior, and interface electrical properties of the sandwich structure and the microstructure changes in Zn, Sn, and Cu driven by heat and electricity were investigated. The experimental results revealed that thermal effects caused marked diffusion of Cu atoms. Cu6Sn5 IMC was formed at the Cu–Sn interface, and Cu5Sn8 was formed at the Zn–Sn interface. The electron flow drove Sn atoms into Cu with directional diffusion and inhibited Cu6Sn5 formation. Moreover, the overall electrical properties, interlayer thickness, and microstructure differences varied with the diffusion behavior and interface composition caused by thermal and electrical effects. |
topic |
Interface Thermal diffusion Electrically induced crystallization (EIC) Directional diffusion |
url |
http://www.sciencedirect.com/science/article/pii/S2238785420319657 |
work_keys_str_mv |
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