Use of strain-life models with wavelet bump extraction (WBE) for predicting fatigue damage

Use of strain-life models with wavelet bump extraction (WBE) for predicting fatigue damage

Bibliographic Details
Main Authors: Shahrum Abdullah (Author), Choi, Jae-Chil (Author), John R. Yates (Author)
Format: Article
Language:English
Published: 2008.
Online Access:Get fulltext

Internet

Get fulltext

Similar Items