Depth distribution profile of martensite phase observed by transmission electron microscope in ion implanted metals
In this work, transmission electron microscopy (TEM) observation results from a depth distribution profile of the nano-martensite occuring in titanium implanted austenitic stainless steel is presented. The thickness of 200 keV high-energy ion implantation induced layer until 150 nm as calculated by...
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| Format: | Article |
| Language: | English |
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2011.
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| Online Access: | Get fulltext |