Non-destructive dielectric measurements and calibration for thin materials using waveguide-coaxial adaptors

This paper focuses on the calibration of apertures for rectangular waveguides using open-short-load (OSL) standards and transmission-line (TL) approaches. The reflection coefficients that were measured using both calibration techniques were compared with the coefficients acquired using the thru-refl...

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Bibliographic Details
Main Authors: You, Kok Yeow (Author), Abbas, Zulkifly (Author), Abdul Malek, Mohamed Fareq (Author), Cheng, E. M. (Author)
Format: Article
Language:English
Published: Slovak Academy of Sciences - Inst. Measurement Science, 2014.
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