Fundamental sensor development in electrical resistance tomography

Fundamental sensor development in electrical resistance tomography

This paper will provide a fundamental understanding of one of the most commonly used tomography, Electrical Resistance Tomography (ERT). Unlike the other tomography systems, ERT displayed conductivity distribution in the Region of Interest (ROI) and commonly associated to Sensitivity Theorem in thei...

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Bibliographic Details
Main Authors: Ling, En Hong (Author), Abdul Rahim, Ruzairi (Author), Ahmad, Anita (Author), Md. Yunus, Mohd. Amri (Author), Aba, Khairul Hamimah (Author), Leow, Leow Pei (Author), Wahid, Herman (Author), Ahmad, Nasarudin (Author), Abd. Shaib, Mohd. Fadzli (Author), Abdul Wahab, Yasmin (Author), Aw, Suzanna Ridzuan (Author), Rahiman, Hafiz Fazalul (Author), Zakaria, Zulkarnay (Author)
Format: Article
Language:English
Published: Penerbit UTM Press, 2015-02.
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
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