Surface plasmon resonance sensor of silver film based on Kretchmann configuration
Performance of a surface plasmon resonance (SPR) sensor based on Kretchmann configuration for silver (Ag) film is evaluated via theoretical simulation. The film thickness and incident angle are varied to obtain the SPR wavelength in the range of 500-550 nm. Shift of SPR wavelength with refractive in...
Main Authors: | , , |
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Format: | Article |
Language: | English |
Published: |
Penerbit UTM Press,
2015.
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Subjects: | |
Online Access: | Get fulltext |