Compact modeling of strained GAA SiNW

Strain-based on advanced MOSFET is a promising candidate for the future of CMOS technology. A numerical model is not favorable compared to a compact model because it cannot be integrated into most simulator software. Thus, a compact model is proposed to overcome the shortcomings in the analytical mo...

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Bibliographic Details
Main Authors: Hamid, F. K. A. (Author), Alias, N. E. (Author), Ismail, R. (Author), Razali, M. A. (Author)
Format: Article
Language:English
Published: Institute of Advanced Engineering and Science, 2019-04.
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