Adhesion of voids to bimetal interfaces with non-uniform energies
Interface engineering has become an important strategy for designing radiation-resistant materials. Critical to its success is fundamental understanding of the interactions between interfaces and radiation-induced defects, such as voids. Using transmission electron microscopy, here we report an inte...
| Main Authors: | , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
Nature Publishing Group,
2015-12-28T14:16:19Z.
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| Subjects: | |
| Online Access: | Get fulltext |