Defect and temperature dependence of tunneling in InAs/GaSb heterojunctions

We assess the origin of the reported temperature dependence of subthreshold slope in many published tunnel field effect transistors (TFETs) by examining the temperature dependence of the intrinsic tunneling at InAs/GaSb interfaces in the absence of three-terminal parasitics. We compare the temperatu...

Full description

Bibliographic Details
Main Authors: Iutzi, Ryan (Ryan Michael) (Contributor), Fitzgerald, Eugene A. (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering (Contributor)
Format: Article
Language:English
Published: American Institute of Physics (AIP), 2016-03-28T18:02:14Z.
Subjects:
Online Access:Get fulltext