Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material

Transient terahertz photoconductivity measurements of minority-carrier lifetime in tin sulfide thin films: Advanced metrology for an early stage photovoltaic material

Materials research with a focus on enhancing the minority-carrier lifetime of the light-absorbing semiconductor is key to advancing solar energy technology for both early stage and mature material platforms alike. Tin sulfide (SnS) is an absorber material with several clear advantages for manufactur...

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Bibliographic Details
Main Authors: Sher, Meng-Ju (Author), Yang, Chuanxi (Author), Hartman, Katy (Contributor), Lindenberg, Aaron M. (Author), Gordon, Roy G. (Author), Jaramillo, Rafael (Contributor), Ofori-Okai, Benjamin Kwasi (Contributor), Steinmann, Vera (Contributor), Nelson, Keith Adam (Contributor), Buonassisi, Tonio (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Chemistry (Contributor), Massachusetts Institute of Technology. Department of Materials Science and Engineering (Contributor), Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor)
Format: Article
Language:English
Published: American Institute of Physics (AIP), 2016-04-04T17:34:53Z.
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