Coupling and stacking order of ReS[subscript 2] atomic layers revealed by ultralow-frequency Raman spectroscopy

Coupling and stacking order of ReS[subscript 2] atomic layers revealed by ultralow-frequency Raman spectroscopy

We investigate the ultralow-frequency Raman response of atomically thin ReS[subscript 2], a special type of two-dimensional (2D) semiconductors with unique distorted 1T structure. Bilayer and few-layer ReS[subscript 2] exhibit rich Raman spectra at frequencies below 50 cm[superscript -1], where a pa...

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Bibliographic Details
Main Authors: He, Rui (Author), Yan, Jia-An (Author), Yin, Zongyou (Author), Ye, Zhipeng (Author), Ye, Gaihua (Author), Cheng, Jason (Author), Lui, C. H. (Author), Li, Ju (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Nuclear Science and Engineering (Contributor)
Format: Article
Language:English
Published: American Chemical Society (ACS), 2017-04-10T16:10:32Z.
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