A big-data approach to handle process variations: Uncertainty quantification by tensor recovery

Stochastic spectral methods have become a popular technique to quantify the uncertainties of nano-scale devices and circuits. They are much more efficient than Monte Carlo for certain design cases with a small number of random parameters. However, their computational cost significantly increases as...

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Bibliographic Details
Main Authors: Zhang, Zheng (Contributor), Weng, Tsui-Wei (Contributor), Daniel, Luca (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2017-04-26T15:29:29Z.
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