Single-Particle Time-of-Flight Mass Spectrometry Utilizing a Femtosecond Desorption and Ionization Laser

Single-Particle Time-of-Flight Mass Spectrometry Utilizing a Femtosecond Desorption and Ionization Laser

Single-particle time-of-flight mass spectrometry has now been used since the 1990s to determine particle-to-particle variability and internal mixing state. Instruments commonly use 193 nm excimer or 266 nm frequency-quadrupled Nd:YAG lasers to ablate and ionize particles in a single step. We describ...

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Bibliographic Details
Main Authors: Abdelmonem, Ahmed (Author), Mohr, Claudia (Author), Saathoff, Harald (Author), Froyd, Karl D. (Author), Murphy, Daniel M. (Author), Zawadowicz, Maria Anna (Contributor), Leisner, Thomas Konrad (Contributor), Cziczo, Daniel James (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Civil and Environmental Engineering (Contributor), Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences (Contributor), Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Cziczo, Daniel J (Contributor)
Format: Article
Language:English
Published: American Chemical Society (ACS), 2017-06-01T13:20:29Z.
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