Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average...

Full description

Bibliographic Details
Main Authors: Beyler, Andrew P. (Contributor), Bischof, Thomas Stanley (Contributor), Cui, Jian (Contributor), Coropceanu, Igor (Contributor), Harris, Daniel Kelly (Contributor), Bawendi, Moungi G (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Chemistry (Contributor)
Format: Article
Language:English
Published: American Chemical Society (ACS), 2017-07-05T13:26:12Z.
Subjects:
Article
Online Access:Get fulltext

Internet

Get fulltext

Similar Items