In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon

The mechanism responsible for deformation-induced crystalline-to-amorphous transition (CAT) in silicon is still under considerable debate, owing to the absence of direct experimental evidence. Here we have devised a novel core/shell configuration to impose confinement on the sample to circumvent ear...

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Bibliographic Details
Main Authors: Zhang, Wei (Author), Zhuang, Zhuo (Author), Ma, En (Author), Shan, Zhi-Wei (Author), Wang, Yue-Cun (Author), Wang, Liyuan (Contributor), Li, Ju (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Brain and Cognitive Sciences (Contributor), Massachusetts Institute of Technology. Department of Nuclear Science and Engineering (Contributor)
Format: Article
Language:English
Published: Springer Nature, 2018-07-24T13:52:04Z.
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