Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy

Characterization of thin film evaporation in micropillar wicks using micro-Raman spectroscopy

Thin film evaporation on microstructured surfaces is a promising strategy for high heat flux thermal management. To enhance fundamental understanding and optimize the overall heat transfer performance across a few microns thick liquid film, however, requires detailed thermal characterizations. Exist...

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Bibliographic Details
Main Authors: Zhang, Lenan (Contributor), Zhu, Yangying (Contributor), Lu, Zhengmao (Contributor), Zhao, Lin (Contributor), Bagnall, Kevin R. (Contributor), Rao, Sameer R (Contributor), Wang, Evelyn (Contributor)
Other Authors: Lincoln Laboratory (Contributor), Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: American Institute of Physics (AIP), 2019-01-24T18:53:01Z.
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