Nanoscale Vector dc Magnetometry via Ancilla-Assisted Frequency Up-Conversion

Nanoscale Vector dc Magnetometry via Ancilla-Assisted Frequency Up-Conversion

Sensing static magnetic fields with high sensitivity and spatial resolution is critical to many applications in fundamental physics, bioimaging, and materials science. Even more beneficial would be full vector magnetometry with nanoscale spatial resolution. Several versatile magnetometry platforms h...

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Bibliographic Details
Main Authors: Liu, Yixiang (Contributor), Ajoy, Ashok (Contributor), Cappellaro, Paola (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Department of Nuclear Science and Engineering (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: American Physical Society, 2019-03-14T19:06:28Z.
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