Fabrication of high aspect ratio AFM probes with different materials inspired by TEM "lift-out" method
The most commonly used materials in all commercially available high-aspect-ratio (HAR) nanowire's (NW) tips are made of silicon and carbon nanotube which limit their applications in other types of atomic force microscopy (AFM), such as conducting AFM and magnetic force microscope. Therefore, a...
| Main Authors: | , , |
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| Other Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
American Vacuum Society,
2020-07-15T20:20:22Z.
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| Subjects: | |
| Online Access: | Get fulltext |