Global optimization for accurate determination of EBSD pattern centers
Accurate pattern center determination has long been a challenge for the electron backscatter diffraction (EBSD) community and is becoming critically accuracy-limiting for more recent advanced EBSD techniques. Here, we study the parameter landscape over which a pattern center must be fitted in quanti...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
Elsevier BV,
2020-09-11T22:29:48Z.
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| Subjects: | |
| Online Access: | Get fulltext |