Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips

Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips

Integrated photonics is poised to become a mainstream solution for high-speed data communications and sensing in harsh radiation environments, such as outer space, high-energy physics facilities, nuclear power plants, and test fusion reactors. Understanding the impact of radiation damage in optical...

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Bibliographic Details
Main Authors: Du, Qingyang (Author), Michon, Jerome (Author), Li, Bingzhao (Author), Kita, Derek M. (Author), Ma, Danhao (Author), Zuo, Haijie (Author), Yu, Shaoliang (Author), Gu, Tian (Author), Agarwal, Anuradha (Author), Li, Mo (Author), Hu, Juejun (Author)
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering (Contributor), Massachusetts Institute of Technology. Materials Research Laboratory (Contributor)
Format: Article
Language:English
Published: Optical Society of America (OSA), 2020-10-19T18:18:21Z.
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