Residual Model Learning for Microrobot Control

Bibliographic Details
Main Authors: Gruenstein, Joshua (Author), Chen, Tao (Author), Doshi, Neel (Author), Agrawal, Pulkit (Author)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2022-05-24T19:29:01Z.
Subjects:
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