Polarimetry with a soft x-ray spectrometer
An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to det...
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| Other Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
Society of Photo-optical Instrumentation Engineers,
2010-03-17T15:00:28Z.
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| Subjects: | |
| Online Access: | Get fulltext |