Thermal and Optical Characterization of Photonic Integrated Circuits by Thermoreflectance Microscopy
We report high resolution, non-invasive, thermal and optical characterization of semiconductor optical amplifiers (SOAs) and SOA-based photonic integrated circuits (PICs) using thermoreflectance microscopy. Chip-scale temperature imaging of SOAs and PICs, along with an energy balance model, are used...
| Main Authors: | , , , |
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| Other Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers,
2010-05-10T20:53:46Z.
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| Subjects: | |
| Online Access: | Get fulltext |