Experimental analysis of two measurement techniques to characterize photodiode linearity
As photodiodes become more linear, accurately characterizing their linearity becomes very challenging. We compare the IMD3 results from a standard two tone measurement to those from a more complex three tone measurement technique. A Ge n-i-p waveguide photodetector on Silicon-on-Insulator (SOI) subs...
| Main Authors: | , , , , , , , , |
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| Other Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
Institute of Electrical and Electronics Engineers,
2010-12-14T17:17:43Z.
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| Subjects: | |
| Online Access: | Get fulltext |