Shape and strain-induced magnetization reorientation and magnetic anisotropy in thin film Ti/CoCrPt/Ti lines and rings

The contributions to the magnetic anisotropy of thin-film rings and lines of width 50 nm and above made from Ti(5 nm)/Co[subscript 0.66]Cr[subscript 0.22]Pt[subscript 0.12] (10 and 20 nm)/Ti (3 nm) with a perpendicular magnetocrystalline anisotropy are investigated, using magnetic force microscopy t...

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Bibliographic Details
Main Authors: Velazquez, D. (Author), Nam, C. H. (Contributor), Ross, Caroline A. (Contributor), Navas, David Otero (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering (Contributor)
Format: Article
Language:English
Published: American Physical Society, 2011-02-11T19:17:46Z.
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